BooksTesting of materialsMaterials scienceInterdisciplinary studiesBiophysicsNanotechnology
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph, Newbury, Dale E., Joy, David C., Echlin, Patrick, Lyman, Charles E., Sawyer, Linda, Lifshin, Eric, Michael, J.R.
Product Details
Author
Goldstein, Joseph, Newbury, Dale E., Joy, David C., Echlin, Patrick, Lyman, Charles E., Sawyer, Linda, Lifshin, Eric, Michael, J.R.
Publisher
Springer
Published
2003
Pages
708
Binding
Hardcover
Edition
3rd
ISBN
9780306472923
Language
English
Genre
Testing of materials, Materials science, Interdisciplinary studies, Biophysics, Nanotechnology
Category
Books