BooksTECHNOLOGY & ENGINEERING/Superconductors & Superconductivity
Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques
by Behnam Ghavami, Mohsen Raji
Product Details
Author
Behnam Ghavami, Mohsen Raji
Publisher
Springer Nature
Published
2021
Binding
Paperback
ISBN
9783030516123
Language
English
Genre
TECHNOLOGY & ENGINEERING/Superconductors & Superconductivity
Category
Books